UPW Process Events Monitoring using Online Particle Counters

Date Published: 2024 | Conference materials

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Nanoparticles are critical contaminants in ultrapure water, so particle counting and metrology are an ever-growing focus for semiconductor manufacturing. An investigation of which type of particle counter is best suited to accurately quantify particles in ultrapure water, paying attention to equipment placement at various locations throughout the treatment process.

Companies:Ovivo
Authors: Najib Alia, Ian Briggs, Philippe Rychen, Lisa Klammsteiner
Tags: Particle CountingUltraPure WaterUPW MetrologyAcoustic Particle Counting (APC)Optical Particle Counter

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