Measuring contamination from 2 to 15nm to characterize UPW and UPW filters 

Date Published: 2026 | Conference materials

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Conventional online UPW particle monitoring cannot reliably measure particles below about 20 nm, even as filtration requirements continue to tighten. This presentation describes a spray-drying approach combining stable atomization with scanning mobility particle sizing to monitor UPW quality and characterize filters in the 2 to 15 nm range. Using monodisperse macromolecule challenges, it presents retention efficiency curves for two filters.

Authors: Dan Troolin
Tags: UPW Metrology

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