TSI Incorporated is an international leader in measurement technology in high-sensitivity particle counting, offering a range of instruments to reduce the risk during fabrication processes by detecting sub-micron and nanoparticles that contaminate products, including but not limited to semiconductor applications. TSI also offers other high-sensitivity particle counting instruments. TSI 0.1 µm airborne particle counters and 10 nm cleanroom condensation particle counters are designed to meet the critical needs of the semiconductor industry by providing complete contamination detection ≥10 nm.