With a B.S. in Electrical Engineering and graduate coursework in Optical and Aeronautical Engineering from the University of Colorado, Steve brings over three decades of experience developing and applying advanced particle monitoring and contamination control technologies across semiconductor, aerospace, and defense sectors.

Steve is a published contributor to the Semiconductor Manufacturing Handbook (Random Hill Publishers, 2005), authoring Chapter 42: Particle Monitoring in Semiconductor Manufacturing. He also authored Basic Guide to Particle Technology (2nd ed. 2002; 3rd ed. 2015) and has written more than 100 technical papers and application notes.

His technical expertise has supported cleanroom monitoring programs for the Space Shuttle, James Webb Space Telescope, U.S. Air Force, and SpaceX Dragon Crew Module. He has also lectured at leading institutions including SUNY Albany, National Taiwan University, UCLA, University of Texas, and the University of Colorado, covering topics in particle physics and mechanics.

Today, as Global Product Manager at TSI, he continues driving innovation, shaping product strategy, and helping TSI lead the field in precision environmental monitoring and contamination control.